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FIELD EFFECT TRANSISTOR HAVING A STRESSED CONTACT ETCH STOP LAYER WITH REDUCED CONFORMALITY
FIELD EFFECT TRANSISTOR HAVING A STRESSED CONTACT ETCH STOP LAYER WITH REDUCED CONFORMALITY
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机译:具有减小的保形性的应力接触式止动层的场效应晶体管
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摘要
By forming a highly non-conformal stressed overlayer, such as a contact etch stop layer, the efficiency of the stress transfer into the respective channel region of a field effect transistor may be significantly increased. For instance, non-conformal PECVD techniques may be used for forming highly stressed silicon nitride in a non-conformal manner, thereby achieving higher transistor performance for otherwise identical stress conditions.
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