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FIELD EFFECT TRANSISTOR HAVING A STRESSED CONTACT ETCH STOP LAYER WITH REDUCED CONFORMALITY

机译:具有减小的保形性的应力接触式止动层的场效应晶体管

摘要

By forming a highly non-conformal stressed overlayer, such as a contact etch stop layer, the efficiency of the stress transfer into the respective channel region of a field effect transistor may be significantly increased. For instance, non-conformal PECVD techniques may be used for forming highly stressed silicon nitride in a non-conformal manner, thereby achieving higher transistor performance for otherwise identical stress conditions.
机译:通过形成高度非共形的应力覆盖层,例如接触蚀刻停止层,应力转移到场效应晶体管的各个沟道区域中的效率可以显着提高。例如,非保形PECVD技术可以用于以非保形方式形成高应力氮化硅,从而在其他相同的应力条件下实现更高的晶体管性能。

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