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Electronic devices created thereby and improved method for producing ultra low dielectric constant materials as intralevel or interlevel dielectrics in semiconductor devices in

机译:由此产生的电子器件以及用于制造超低介电常数材料作为半导体器件中的层内或层间电介质的改进方法。

摘要

A method for fabricating a thermally stable ultralow dielectric constant film including Si, C, O and H atoms in a parallel plate chemical vapor deposition process utilizing a plasma enhanced chemical vapor deposition ("PECVD") process is disclosed. Electronic devices containing insulating layers of thermally stable ultralow dielectric constant materials that are prepared by the method are further disclosed. To enable the fabrication of a thermally stable ultralow dielectric constant film, specific precursor materials are used, such as, silane derivatives, for instance, diethoxymethylsilane (DEMS) and organic molecules, for instance, bicycloheptadiene and cyclopentene oxide.
机译:公开了一种在利用等离子体增强化学气相沉积(“ PECVD”)工艺的平行板化学气相沉积工艺中制造包括Si,C,O和H原子的热稳定的超低介电常数膜的方法。进一步公开了包含通过该方法制备的包含热稳定的超低介电常数材料的绝缘层的电子设备。为了能够制造热稳定的超低介电常数膜,使用特定的前体材料,例如硅烷衍生物,例如二乙氧基甲基硅烷(DEMS)和有机分子,例如双环庚二烯和环戊烯氧化物。

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