首页> 外国专利> FAILURE ANALYSIS SUPPORT DEVICE, FAILURE ANALYSIS SUPPORT METHOD, FAILURE ANALYSIS SUPPORTING PROGRAM, AND RECORDING MEDIUM RECORDING FAILURE ANALYSIS SUPPORTING PROGRAM

FAILURE ANALYSIS SUPPORT DEVICE, FAILURE ANALYSIS SUPPORT METHOD, FAILURE ANALYSIS SUPPORTING PROGRAM, AND RECORDING MEDIUM RECORDING FAILURE ANALYSIS SUPPORTING PROGRAM

机译：故障分析支持设备，故障分析支持方法，故障分析支持程序和记录中记录故障分析支持程序

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摘要

PPROBLEM TO BE SOLVED: To provide a failure analysis support device capable of efficient analysis of causes for a failure. PSOLUTION: In extracting a failure part, a range of the degree of abruptness one desires to extract is first designated (S21). As a method for designating the range, something abnormal more than a threshold value or not abnormal is designated. Ranges are divided in advance and a selection may be made out of them. Then, within the designated range, a pareto chart is created (S22). On the basis of the created pareto chart, a failure is extracted (S23) and its causes are analyzed (S24). PCOPYRIGHT: (C)2008,JPO&INPIT

机译：

要解决的问题：提供一种故障分析支持设备，该设备能够有效分析故障原因。

解决方案：在提取故障部位时，首先指定一个人希望提取的突变程度的范围（S21）。作为指定范围的方法，指定了大于阈值的异常或非异常的东西。范围是预先划分的，可以从中进行选择。然后，在指定范围内，创建一个视差表（S22）。基于所创建的对等图，提取故障（S23）并分析其原因（S24）。

版权：（C）2008，日本特许厅＆INPIT 展开▼

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公开/公告号JP2008015663A

专利类型
公开/公告日2008-01-24

原文格式PDF
申请/专利权人 OMRON CORP;
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申请/专利号JP20060184379
发明设计人 KISHIMOTO MAYUKO;SOMA KOJI;MORI HIROYUKI;
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申请日2006-07-04
分类号G05B19/418;
国家 JP
入库时间 2022-08-21 20:22:20

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