首页> 外国专利> SCANNING PROBE MICROSCOPE PROBE AND PRODUCTION METHOD THEREFOR AND SCANNING PROBE MICROSCOPE AND APPLICATION METHOD THEREFOR AND NEEDLE-LIKE ELEMENT AND PRODUCTION METHOD THEREFOR AND ELECTRON ELEMENT AND PRODUCTION METHOD THEREFOR AND CHARGE DENSITY WAVE QUANTUM PHASE MICROSCOPE AND CHARGE DENSITY WAVE QUANTUM INTERFEROMET

SCANNING PROBE MICROSCOPE PROBE AND PRODUCTION METHOD THEREFOR AND SCANNING PROBE MICROSCOPE AND APPLICATION METHOD THEREFOR AND NEEDLE-LIKE ELEMENT AND PRODUCTION METHOD THEREFOR AND ELECTRON ELEMENT AND PRODUCTION METHOD THEREFOR AND CHARGE DENSITY WAVE QUANTUM PHASE MICROSCOPE AND CHARGE DENSITY WAVE QUANTUM INTERFEROMET

机译：扫描探针显微探针及其生产方法，扫描探针显微及其应用方法，针状元素和生产方法，以及电荷密度波量子相显微镜和电荷密度波

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摘要

A scanning probe microscope probe is produced by depositing a raw-material film on the surface of a cone made of Si, etc. and growing a needle-like crystal by using the raw-material film by irradiating an energy beam to a point on the cone at a predetermined distance along the side surface from the cone tip under such conditions as not to melt the cone. Also, a charge density wave quantum phase microscope is provided which uses a probe made of a charge density wave crystal. Also, a charge density wave quantum interferometer is provided which uses the needle-like crystal formed from the charge densitywave crystal. Also, the scanning probe microscope probe is formed from a pressure-induced superconducting substance.

机译：扫描探针显微镜探针是通过将原料膜沉积在由Si等制成的圆锥体的表面上，并通过将能量束照射到靶上的点而使用该原料膜来生长针状晶体而制成的。在不熔化圆锥体的条件下，沿着与圆锥体尖端的侧面预定距离处的圆锥体。另外，提供了使用由电荷密度波晶体制成的探针的电荷密度波量子相显微镜。而且，提供了一种电荷密度波量子干涉仪，其使用由电荷密度波晶体形成的针状晶体。而且，扫描探针显微镜探针由压力诱导的超导物质形成。

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公开/公告号EP1744143A1

专利类型
公开/公告日2007-01-17

原文格式PDF
申请/专利权人 JAPAN SCIENCE AND TECHNOLOGY AGENCY;
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申请/专利号EP20050736881
发明设计人 TANDA SATOSHI;ODA MIGAKU;INAGAKI KATSUHIKO;OHKAWA HIROYUKI;TOSHIMA TSUYOSHI;MOMONO NAOKI;NISHIDA MUNEHIROGRAD.SCHOOL OF ENG.HOKKAIDO UNI;IDO MASAYUKI;
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申请日2005-04-22
分类号G01N13/10;B82B1;B82B3;G12B21/02;
国家 EP
入库时间 2022-08-21 20:47:48

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