首页> 外国专利> SCANNING PROBE MICROSCOPE PROBE AND PRODUCTION METHOD THEREFOR AND SCANNING PROBE MICROSCOPE AND APPLICATION METHOD THEREFOR AND NEEDLE-LIKE ELEMENT AND PRODUCTION METHOD THEREFOR AND ELECTRON ELEMENT AND PRODUCTION METHOD TEHREFOR AND CHARGE DENSITY WAVE QUANTUM PHASE MICROSCOPE AND CHARGE DENSITY WAVE QUANTUM INTERFEROMET

SCANNING PROBE MICROSCOPE PROBE AND PRODUCTION METHOD THEREFOR AND SCANNING PROBE MICROSCOPE AND APPLICATION METHOD THEREFOR AND NEEDLE-LIKE ELEMENT AND PRODUCTION METHOD THEREFOR AND ELECTRON ELEMENT AND PRODUCTION METHOD TEHREFOR AND CHARGE DENSITY WAVE QUANTUM PHASE MICROSCOPE AND CHARGE DENSITY WAVE QUANTUM INTERFEROMET

机译：扫描探针显微探针及其生产方法，扫描探针显微及其应用方法，针状元素和生产方法，折射和电荷密度波量子数量级显微镜和电荷密度波

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摘要

A material film is deposited on the surface of a circular cone consisting of Si or the like and an electron beam is applied to a portion a specified distance away from the tip end of the circular cone along its side surface under the condition of not melting the circular cone to thereby grow needle-like crystal using the material film, whereby a scanning probe microscope probe is produced. A probe consisting of charge density wave crystal is used to constitute a charge density wave quantum phase microscope. Also, needle-like crystal consisting of charge density wave crystal is used to constitute a charge density wave quantum interferometer. In addition, a material consisting of pressure-induced superconducting substance is used for a scanning probe microscope probe.

机译：在不熔化硅的条件下，将材料膜沉积在由Si等组成的圆锥表面上，并沿其侧面将电子束沿其侧面施加到距圆锥尖端一定距离的部分。圆锥体，从而利用材料膜生长出针状晶体，从而生产出扫描探针显微镜探针。由电荷密度波晶体组成的探针被用来构成电荷密度波量子相显微镜。另外，由电荷密度波晶体构成的针状晶体被用于构成电荷密度波量子干涉仪。另外，由压力感应的超导物质组成的材料被用于扫描探针显微镜探针。

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公开/公告号WO2005103646A1

专利类型
公开/公告日2005-11-03

原文格式PDF
申请/专利权人 JAPAN SCIENCE AND TECHNOLOGY AGENCY;TANDA SATOSHI;ODA MIGAKU;INAGAKI KATSUHIKO;OHKAWA HIROYUKI;TOSHIMA TSUYOSHI;MOMONO NAOKI;NISHIDA MUNEHIRO;IDO MASAYUKI;
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申请/专利号WO2005JP08259
发明设计人 TANDA SATOSHI;ODA MIGAKU;INAGAKI KATSUHIKO;OHKAWA HIROYUKI;TOSHIMA TSUYOSHI;MOMONO NAOKI;NISHIDA MUNEHIRO;IDO MASAYUKI;
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申请日2005-04-22
分类号G01N13/10;B82B1/00;B82B3/00;G12B21/02;
国家 WO
入库时间 2022-08-21 22:08:06

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