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Radiation hardening, detection amp; protection design methods and circuit examples thereof

机译:辐射硬化,检测和防护设计方法及其电路实例

摘要

Radiation hardening, detection and protection design methods are disclosed. An example write drive circuit is disclosed having radiation hardened analog circuitry. A passive transistor is provided to generate a radiation photo-current to offset any net radiation photo-current of the operational circuitry. Using this technique, a radiation hardened reference-mirror control circuit provides a switched write current for setting the logical state of MRAM bits during a radiation event, for instance. A radiation detector and radiation hardened logic gates are further provided for inhibiting the write current when a radiation level is above a predetermined level.
机译:公开了辐射硬化,检测和防护设计方法。公开了具有辐射硬化模拟电路的示例性写入驱动电路。提供无源晶体管以产生辐射光电流以抵消操作电路的任何净辐射光电流。使用这种技术,例如,辐射硬化的参考镜控制电路提供了一个切换的写入电流,用于在辐射事件期间设置MRAM位的逻辑状态。还提供了辐射检测器和辐射硬化逻辑门,用于在辐射水平高于预定水平时抑制写电流。

著录项

  • 公开/公告号US2007075390A1

    专利类型

  • 公开/公告日2007-04-05

    原文格式PDF

  • 申请/专利权人 LANCE L. SUNDSTROM;

    申请/专利号US20050240882

  • 发明设计人 LANCE L. SUNDSTROM;

    申请日2005-09-30

  • 分类号H01L31/00;

  • 国家 US

  • 入库时间 2022-08-21 21:02:45

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