首页> 外国专利> Depositing films on substrate, e.g. liner or barrier layer in semiconductor devices, by depositing first films of target material with magnetron, and depositing second film using reactive physical vapor deposition process with magnetron

Depositing films on substrate, e.g. liner or barrier layer in semiconductor devices, by depositing first films of target material with magnetron, and depositing second film using reactive physical vapor deposition process with magnetron

机译:在基板上沉积薄膜,例如通过使用磁控管沉积目标材料的第一膜,并使用磁控管进行反应性物理气相沉积工艺沉积第二膜,从而在半导体器件中形成衬里或阻挡层

摘要

Depositing films on a substrate comprises depositing a first film of target material with a magnetron at a first inner offset position relative to the axis, and depositing a second film using a reactive physical vapor deposition process with the magnetron at a second outer offset position. Depositing films on a substrate using a plasma chamber having a target disposed about an axis and a magnetron rotatable about the axis at an adjustable offset from the axis to vary the pattern of ions impinging on the target, comprises: (a) depositing a first film of target material with the magnetron at a first inner offset position relative to the axis; and (b) depositing in the same chamber, a second film using a reactive physical vapor deposition process with the magnetron at a second outer offset position.
机译:在衬底上沉积膜包括在磁控管相对于轴的第一内部偏移位置处沉积具有磁控管的目标材料的第一膜,以及在磁控管在第二外部偏移位置处使用反应性物理气相沉积工艺来沉积第二膜。使用等离子体室在衬底上沉积膜,该等离子体室具有围绕轴线设置的靶标和可绕着轴线旋转的磁控管,该磁控管可以相对于轴线以可调节的偏移量变化,以改变撞击到靶材上的离子的图案,包括:(a)沉积第一膜磁控管在相对于轴的第一内部偏移位置处填充目标材料; (b)使用反应性物理气相沉积工艺在磁控管处于第二外部偏移位置的情况下在同一腔室中沉积第二膜。

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