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Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves
Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves
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机译：用于测量大信号S参数的方法和测试装置，该参数包括与入射波的共轭有关的系数
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摘要
The values of the 6 complex parameters of a large-signal S-parameter model of a high frequency device-under-test are determined by using a frequency-offset probe-tone method. A relatively large one tone signal is applied to the input port of the device and a relatively small one tone signal having a frequency offset relative to the frequency of this large one tone signal is applied to the output port of the device. The 6 large-signal S-parameters are found by measuring and processing the spectral components of the incident and the scattered voltage waves at the device signal ports. These spectral components appear at 3 frequencies: at the frequency of the large one tone signal, at the frequency of the small one tone signal and at the frequency of the large one tone signal minus the frequency offset of the small one tone signal.
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