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The crystal piece being stored inside the temperature characteristic measuring method null package of the temperature characteristic measurement equipment and the crystal vibrating device which have the temperature characteristic measurement jig

机译:具有温度特性测量夹具的温度特性测量设备和晶体振动装置的温度特性测量方法零组件内部存储的晶体片

摘要

PROBLEM TO BE SOLVED: To obtain high reliability for a measurement result of temperature characteristics of an electronic part such as a quartz resonator.;SOLUTION: The quartz resonator 10 to be measured and a reference resonator 11 are housed inside a chamber A. A temperature inside the chamber A is set to a predetermined temperature by means of a Pelitier element 6. When a frequency deviation of the reference resonator 11 matching the predetermined temperature is attained, a switching unit 8 is switched for carrying out measuring operation of a resonance frequency on the quartz resonator 10, and a measurement result is outputted to a network analyzer 3.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:为了获得诸如石英谐振器之类的电子部件的温度特性的测量结果的高可靠性;解决方案:将要测量的石英谐振器10和参考谐振器11容纳在腔室A内。借助于珀利帖元件6将腔室A内部的温度设置为预定温度。当参考谐振器11的频率偏差与预定温度匹配时,切换单元8被切换以执行谐振频率的测量操作。石英谐振器10,并将测量结果输出到网络分析仪3。版权所有:(C)2003,JPO

著录项

  • 公开/公告号JP3778046B2

    专利类型

  • 公开/公告日2006-05-24

    原文格式PDF

  • 申请/专利权人 株式会社大真空;

    申请/专利号JP20010311783

  • 发明设计人 三浦 孝信;草井 強;

    申请日2001-10-09

  • 分类号G01R29/22;G01R31/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:50:19

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