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Non-confocal, confocal, and substrate caused by the interference confocal microscopy - compensation of the refractive index mismatch effect in the medium interface
Non-confocal, confocal, and substrate caused by the interference confocal microscopy - compensation of the refractive index mismatch effect in the medium interface
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机译：干涉共焦显微镜引起的非共焦，共焦和基质-补偿介质界面中的折射率失配效应
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摘要
An interferometric microscope for a target object in a certain medium, to implement the interference measurement of a plurality of positions within the object with a mismatch between the refractive index of the medium between the object and generating an input beam a light source; then receives the input beam, then generate a measurement beam, and generating a feedback measurement beam for spots imaged on the selected spot in the object, said selected, and the feedback measurement beam, the measuring beam configured interferometer to generate an interference beam by combining the reference beam and; includes a detection system arranged and location, so as to receive the interference beam, the feedback measurement beam, the detection system from the object move along a path extending, and a compensation layer made of material disposed position in the path of return measurement beam, said compensation layer, along the path of the return measurement beam, the interferometer, the said object and characterized by generating a refractive index mismatch for compensating the refractive index mismatch between the medium, the interference microscope.
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