首页> 外国专利> LOAD LOCK CHAMBER FOR SEMICONDUCTOR MANUFACTURE ENABLING OBSERVATION OF WAFER SCRATCH AND WAFER SLIDING IN CHAMBER WITH NAKED EYES

LOAD LOCK CHAMBER FOR SEMICONDUCTOR MANUFACTURE ENABLING OBSERVATION OF WAFER SCRATCH AND WAFER SLIDING IN CHAMBER WITH NAKED EYES

机译:半导体制造的负载锁定腔室,使观察带有裸眼的腔室中的晶圆刮擦和晶圆滑动

摘要

Purpose: the load lock chamber for semiconductors manufacture is arranged to carry out the position adjustment an of box, is grabbed by enabling a processor of observation for a chip and a chip slip event in the load lock chamber with naked eyes. Construction: the load lock chamber (100) for semiconductors manufacture includes an inner space, an opening (110), an external door (120) and a smooth device (160). Inner space includes an elevator (140), and a wafer cassette is mounted on it. Open service is directed to inner space or collected from inner space as the paths for being used for wafer cassette. External door includes a show window (130), close/open opening. One inside of room can pass through show window. Light device is implemented in inner space.
机译:目的:用于半导体制造的负载锁定腔室被布置为执行盒的位置调整,通过使处理器能够用肉眼观察负载锁定腔室中的芯片和芯片打滑事件来抓住它。结构:用于半导体制造的负载锁定腔室(100)包括内部空间,开口(110),外门(120)和平滑装置(160)。内部空间包括升降器(140),并且晶片盒安装在其上。开放服务被导向内部空间或从内部空间收集作为用于晶片盒的路径。外门包括显示窗(130),关闭/打开开口。房间的一间可以穿过橱窗。照明装置安装在内部空间中。

著录项

  • 公开/公告号KR20040095074A

    专利类型

  • 公开/公告日2004-11-12

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20030028676

  • 发明设计人 SHIN IL GWON;

    申请日2003-05-06

  • 分类号H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:35

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