首页> 外国专利> Position measurement system for a position control loop and a position measurement machine combines first accurate measurements with less accurate measurements to obtain highly dynamic and accurate measurements

Position measurement system for a position control loop and a position measurement machine combines first accurate measurements with less accurate measurements to obtain highly dynamic and accurate measurements

机译:用于位置控制环和位置测量机的位置测量系统将最初的精确测量与不太精确的测量结合在一起,以获得高度动态和精确的测量

摘要

Combined position measurement system has first (1) and second (2) position measuring systems that generate first more accurate (POS1) and second less accurate (POS2) measurement values that are combined to form a measurement value (POS). A linking unit (7) serves to correct the second position measurement using a correction value (Korr) that is derived from the difference between the first position value and the combined position value. The invention relates particularly to combination of a mechanical feeler system that is stable against environmental fluctuations and a very precise, but less accurate due to environmentally induced fluctuations, interferometer measurement system.
机译:组合位置测量系统具有第一(1)和第二(2)位置测量系统,它们会生成第一更准确的(POS1)和第二更不准确的(POS2)测量值,这些测量值组合在一起形成测量值(POS)。链接单元(7)用于使用从第一位置值和组合位置值之间的差得出的校正值(Korr)来校正第二位置测量值。本发明尤其涉及对环境波动稳定并且非常精确但由于环境引起的波动而较不精确的机械测头系统,干涉仪测量系统的组合。

著录项

  • 公开/公告号DE10307048A1

    专利类型

  • 公开/公告日2004-09-09

    原文格式PDF

  • 申请/专利权人 DR. JOHANNES HEIDENHAIN GMBH;

    申请/专利号DE2003107048

  • 发明设计人 WOLFGRUBER KONRAD;

    申请日2003-02-20

  • 分类号G01B21/00;

  • 国家 DE

  • 入库时间 2022-08-21 22:43:24

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