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DESIGN RULE MANUFACTURING METHOD, DESIGN RULE MANUFACTURING SYSTEM AND RECORDING MEDIA THEREOF

机译:设计规则的制作方法,设计规则的制作系统及其记录媒体

摘要

A method for designing a semiconductor integrated circuit is provided which comprises compacting a design layout of a semiconductor integrated circuit on the basis of a given design rule to obtain a compacted pattern, predicting a pattern to be formed at a surface area of a wafer for forming the semiconductor integrated circuit on the basis of the compacted pattern, obtaining an evaluated value by comparing the predicted pattern with the compacted pattern, deciding whether the evaluated value satisfies a predetermined condition, and modifying the design rule when the evaluated value is decided as not satisfying the predetermined condition.
机译:提供一种用于设计半导体集成电路的方法,该方法包括:基于给定的设计规则来压缩半导体集成电路的设计布局以获得紧凑的图案,预测要形成在要形成的晶片的表面区域处的图案。所述半导体集成电路基于所述压缩图案,通过将所述预测图案与所述压缩图案进行比较,确定所述评估值是否满足预定条件,并在确定所述评估值不满足时修改设计规则,来获得评估值。预定条件。

著录项

  • 公开/公告号KR100437980B1

    专利类型

  • 公开/公告日2004-07-02

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20010038245

  • 申请日2001-06-29

  • 分类号H01L21/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:46:53

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