首页> 外国专利> PHASE SHIFT METHOD AND APPARATUS FOR IMPLEMENTING PHASE-CONTRAST OR MODULATION-CONTRAST OBSERVATION ON MICROSCOPES

PHASE SHIFT METHOD AND APPARATUS FOR IMPLEMENTING PHASE-CONTRAST OR MODULATION-CONTRAST OBSERVATION ON MICROSCOPES

机译：在显微镜上进行相衬或调制-对比观测的相移方法和装置

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摘要

The invention concerns an apparatus for implementing phase-contrast or modulation-contrast observation on microscopes with the aid of a modulator (7) arranged in each pupil plane in the observation beam path and containing at least one layer modifying the phase or amplitude, and of a stop (3) arranged in the illumination beam path. For stepless adaptation of the phase shift, the modulator (7) is mounted tiltably. The invention further concerns a method for implementing a defined phase shift.

机译：本发明涉及一种用于借助于在观察光束路径中的每个光瞳平面中布置的调制器（ 7 ）在显微镜上实现相差或调制对比度观察的设备。相位或幅度，以及设置在照明光束路径中的光阑（ 3 ）。为了无级适应相移，调制器（ 7 ）可倾斜地安装。本发明还涉及一种用于实现定义的相移的方法。 展开▼

著录项

公开/公告号US2004120029A1

专利类型

公开/公告日2004-06-24

原文格式PDF

申请/专利权人 KRUEGER RALF;
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申请/专利号US20030605492

发明设计人 RALF KRUEGER;
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申请日2003-10-02

分类号G02B21/00;G02B21/06;

国家 US

入库时间 2022-08-21 23:20:35

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