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OPTICAL INTERFERENCE TYPE AE SENSOR, AE SENSOR UNIT, AND AE MEASUREMENT SYSTEM

机译:光学干涉型AE传感器,AE传感器单元和AE测量系统

摘要

PROBLEM TO BE SOLVED: To provide an AE measurement system for AE analysis from a small- sized substance up to a large-sized one by making an AE sensor extremely small-sized, and preventing detection of an AE signal from being influenced by electromagnetic noises.;SOLUTION: Using a small-sized optical interference type microsensor made using MEMS (Micro Electro Mechanical System) technique, the AE measurement system is formed by an optical signal processing by the use of an AE sensor unit comprised of an optical fiber and optical parts. By selecting a wavelength of a measuring light source, the distance between a substance to be measured and the body of an AE measuring portion can be made longer.;COPYRIGHT: (C)2004,JPO
机译:要解决的问题:通过使AE传感器尺寸非常小,并防止AE信号的检测受到电磁噪声的影响,提供一种AE测量系统,用于从小型物质到大型物质的AE分析。解决方案:使用由MEMS(微机电系统)技术制成的小型光学干涉型微传感器,通过使用由光纤和光学传感器组成的AE传感器单元,通过光信号处理来形成AE测量系统。部分。通过选择测量光源的波长,可以使被测物质与AE测量部分的主体之间的距离更长。版权所有:(C)2004,JPO

著录项

  • 公开/公告号JP2003337063A

    专利类型

  • 公开/公告日2003-11-28

    原文格式PDF

  • 申请/专利权人 NIITSUMA HIROAKI;MEMS CORE CO LTD;

    申请/专利号JP20020143913

  • 发明设计人 NIITSUMA HIROAKI;MIYAZAKI MASARU;

    申请日2002-05-20

  • 分类号G01H9/00;B81B3/00;B81B7/00;G01N29/14;G01N29/24;

  • 国家 JP

  • 入库时间 2022-08-21 23:24:11

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