Method and apparatus for characterization of ultrathin silicon oxide films using mirror-enhanced polarized reflectance fourier transform infrared spectroscopy

• 1. 混合物、聚合性组合物、高分子、光学膜、光学各向异性体、偏振片、平板显示装置、有机电致发光显示装置和防反射膜、以及聚合性化合物的使用方法 [P] . 中国专利： CN109890858A . 2019-06-14
• 2. 聚合性化合物及其制造方法、聚合性组合物、高分子、光学膜、光学各向异性体、偏振片、显示装置、防反射膜以及化合物及其使用方法 [P] . 中国专利： CN110392703A . 2019-10-29
• 3. Method and apparatus for characterization of ultrathin silicon oxide films using mirror-enhanced polarized reflectance fourier transform infrared spectroscopy [P] . 美国专利： US6818894B2 . 2004-11-16

  机译： 使用镜面增强的偏振反射傅里叶变换红外光谱法表征超薄氧化硅膜的方法和装置

• 4. METHOD AND APPARATUS FOR CHARACTERIZATION OF ULTRATHIN SILICON OXIDE FILMS USING MIRROR-ENHANCED POLARIZED REFLECTANCE FOURIER TRANSFORM INFRARED SPECTROSCOPY [P] . 世界知识产权组织专利： WO02088683A1 . 2002-11-07

  机译： 利用微镜增强偏振反射傅里叶变换红外光谱表征超薄氧化硅薄膜的方法和装置

• 5. Diffuse reflectance infrared Fourier transform spectroscopy for characterization of earth materials [P] . AU2015268737A1 . 2016-01-07

  机译： 漫反射红外傅里叶变换光谱法用于表征土壤材料

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• 5. In situ Characterization of the Illuminated Silicon/Electrolyte Interface by Fourier Transform Infrared Spectroscopy [R] . Peter, L. M., Blackwood, D., Pons, S. 1988

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