首页>
外国专利>
Evaluation method of the defective height in radiographic test and the standard body for evaluation of defective height and evaluation device null of defective
Evaluation method of the defective height in radiographic test and the standard body for evaluation of defective height and evaluation device null of defective
展开▼
机译：射线照相检查中的缺陷高度的评估方法，缺陷高度的评估标准体以及缺陷的评估装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
PURPOSE: To make it possible to precisely evaluate defect height in one time photographing and improve workability by superimposing a standard piece having a property radioactively equivalent to a test piece on the test piece and photographing them. ;CONSTITUTION: In the test facility, an X-ray irradiation device 1, a test piece 2 with thickness T1 having a defect part S3' and an X-ray film 4 are provided. A standard piece 3 with thickness ΔT having a property radioactively equivalent to the test piece 2 is superimposed on the test piece and they are photographed. From its result, defect height X is found from an expression: X= ln{(D2'-b)/(D1-b)}.ΔT/[ln{(D2-b)/(D1-b)/(D1-b)}.Q]. In the expression, D2' indicates a quantity of reaction of a part S3 equivalent to the defect part S3' in the film 4, D1 shows reaction quantity of the part S1 equivalent to a normal part S1', D2 indicates the reaction quantity of the part S2 equivalent to a superimposed part S2' of the normal part and the standard piece 3, b shows a quantity of a background and Q indicates a previously found standard coefficient.;COPYRIGHT: (C)1995,JPO
展开▼
