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Scribing/Breaking Methods for the Optoelectronic Devices of GaN-Based Semiconductor Films Grown on Sapphire Substrates

机译:蓝宝石衬底上生长的GaN基半导体薄膜的光电子器件的划线/断裂方法

摘要

In the present invention has been to grow the gallium nitride-based semiconductor thin film on sapphire substrate according to the production method for separating a next chip manufactured as an optical element, in particular, chip production method of the gallium nitride-based light emitting device, in which gallium nitride is grown on a sapphire substrate based semiconductor thin film and the metal electrode pattern formed on a said sapphire substrate manufactured as an optical element, the chip separation includes a breaking groove produced by a dry etching method for the semiconductor thin film surface during the one to prevent the formation of micro-cracks on the semiconductor thin film layer and characterized in that.; The present invention, as shown in the above, to form a micro-crack due to excessive ungryeok around the optical element chip by the chip instead of the conventional square type select a chip pattern of a rectangular or flat quadrilateral to select a chip separating line that matches the crystal plane direction It is effective to produce a good chip reliability is not provided.
机译:在本发明中,根据用于分离制造为光学元件的下一个芯片的制造方法,特别是氮化镓基发光器件的芯片制造方法,在蓝宝石衬底上生长氮化镓基半导体薄膜。其中,在基于蓝宝石衬底的半导体薄膜上生长氮化镓并且在形成于所述蓝宝石衬底上的金属电极图案被制造为光学元件,芯片分离包括通过干蚀刻法为半导体薄膜产生的断裂槽。其一是防止在半导体薄膜层上形成微裂纹的表面,其特征在于。如上所述,本发明通过由芯片代替常规的正方形类型,由于芯片周围光学元件芯片上的过多的ungryeok而形成微裂纹,从而选择矩形或平坦四边形的芯片图案来选择芯片分离线与晶面方向匹配的芯片没有提供有效产生良好的芯片可靠性。

著录项

  • 公开/公告号KR100335796B1

    专利类型

  • 公开/公告日2002-05-08

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990008662

  • 发明设计人 조장연;김근주;

    申请日1999-03-15

  • 分类号H01L21/469;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:44

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