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Simplified method for extraction of model parameter set and statistical integrated circuit simulation method using the same
Simplified method for extraction of model parameter set and statistical integrated circuit simulation method using the same
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机译:提取模型参数集的简化方法和使用该方法的统计集成电路仿真方法
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摘要
The present invention in the case of simulation by extracting the n number of model parameters set in order to predict, especially in distribution and variations in performance relates to a method of pre-simulating the performance of the designed integrated circuit, and one model parameter set of elements as in the prior art the extraction by the IV characteristic curve provided by the IV characteristic measured by the objective function, and the remaining n-1 of model parameter set is extracted by the measurement is easy main characteristic data (ET data) to the objective function. Accordingly, IV characteristics, and saves the overhead and time of the measurement, the main characteristics by simulation by changing the data using the extracted model parameter set can be easily predicted in advance a change in circuit performance due to changes in the device characteristics.
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