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Simplified method for extraction of model parameter set and statistical integrated circuit simulation method using the same

机译:提取模型参数集的简化方法和使用该方法的统计集成电路仿真方法

摘要

The present invention in the case of simulation by extracting the n number of model parameters set in order to predict, especially in distribution and variations in performance relates to a method of pre-simulating the performance of the designed integrated circuit, and one model parameter set of elements as in the prior art the extraction by the IV characteristic curve provided by the IV characteristic measured by the objective function, and the remaining n-1 of model parameter set is extracted by the measurement is easy main characteristic data (ET data) to the objective function. Accordingly, IV characteristics, and saves the overhead and time of the measurement, the main characteristics by simulation by changing the data using the extracted model parameter set can be easily predicted in advance a change in circuit performance due to changes in the device characteristics.
机译:在仿真的情况下,本发明通过提取n个模型参数集以进行预测,特别是在性能的分布和变化中进行预测,涉及一种预先仿真所设计的集成电路的性能的方法以及一个模型参数集与现有技术中一样,通过目标函数所测量的IV特性所提供的IV特性曲线来提取元素,并通过测量来提取模型参数集的剩余n-1个容易的主要特性数据(ET数据)目标函数。因此,由于具有IV特性,并且节省了测量的开销和时间,所以可以容易地预先预测由于使用了器件特性的变化而导致的电路性能的变化,从而通过使用提取的模型参数集来改变数据来进行仿真来模拟的主要特性。

著录项

  • 公开/公告号KR100335492B1

    专利类型

  • 公开/公告日2002-05-04

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990046630

  • 发明设计人 이상훈;

    申请日1999-10-26

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:42

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