首页> 外国专利> METHOD FOR MEASURING PARTICLE SIZE OF INCLUSION IN METAL BY EMISSION SPECTRUM INTENSITY OF ELEMENT CONSTITUTING INCLUSION IN METAL, AND METHOD FOR FORMING PARTICLE SIZE DISTRIBUTION OF INCLUSION IN METAL, AND APPARATUS FOR EXECUTING THAT METHOD

METHOD FOR MEASURING PARTICLE SIZE OF INCLUSION IN METAL BY EMISSION SPECTRUM INTENSITY OF ELEMENT CONSTITUTING INCLUSION IN METAL, AND METHOD FOR FORMING PARTICLE SIZE DISTRIBUTION OF INCLUSION IN METAL, AND APPARATUS FOR EXECUTING THAT METHOD

机译：通过金属元素的夹杂物的发射光谱强度测量金属中的夹杂物的粒径的方法，形成金属中的夹杂物的粒径分布的方法以及执行该方法的装置

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摘要

An electronic probe microanalyzer measures the particle size of an inclusion in metal by scanning an area of ζ5mm at an arbitrary position on the surface of a master, defines a calibrating curve indicative of relation of the particle size of inclusion in metal with the emission spectrum intensity of an element constituting the inclusion in metal based on the measured particle size of inclusion in metal, specifies the inclusion in metal existing at an emission spot based on the data of emission spectrum intensity of an element existing at the emission spot on the surface of a sample to be measured, and then measures the particle size of a specified inclusion in metal based on the data of emission spectrum intensity and the calibrating line.

机译：电子探针显微分析仪通过扫描母盘表面任意位置的ζ5mm区域来测量金属中夹杂物的粒径，定义校准曲线以指示金属中夹杂物的粒径与发射光谱强度的关系基于测得的金属中夹杂物的粒径，确定构成金属中夹杂物的元素的含量，基于存在于金属表面的发射点处的元素的发射光谱强度数据，确定存在于发射点处的金属中的夹杂物。待测样品，然后根据发射光谱强度和校准线的数据，测量金属中指定夹杂物的粒径。

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公开/公告号WO02071036A1

专利类型
公开/公告日2002-09-12

原文格式PDF
申请/专利权人 NSK LTD.;NAGASAWA WATARU;
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申请/专利号WO2002JP02085
发明设计人 NAGASAWA WATARU;
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申请日2002-03-06
分类号G01N15/02;G01N21/67;
国家 WO
入库时间 2022-08-22 00:35:02

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