首页> 外国专利> Particle size measurement method of the metal inclusions in by the light emission spectrum strength of the metal inclusions in the constituent elements, and the particle size distribution method of creating metal inclusions, as well as an apparatus for performing the method

Particle size measurement method of the metal inclusions in by the light emission spectrum strength of the metal inclusions in the constituent elements, and the particle size distribution method of creating metal inclusions, as well as an apparatus for performing the method

机译:通过构成元素中的金属夹杂物的发光光谱强度的金属夹杂物的粒径测量方法,产生金属夹杂物的粒径分布方法以及执行该方法的设备

摘要

Measuring the particle size of the metal inclusions in the master electron probe micro analyzer scans the area φ5mm at any location on the surface of the master, based on the particle size of the metal inclusions in the measured, metal Chukai and a calibration curve showing the relationship between the particle size of the metal inclusions to the emission spectrum intensity of the element constituting the stationary object, based on the data of the emission spectrum intensity of the elements present in the light-emitting spots on the surface of the measurement sample, Identify the metal inclusions present in the luminescent spots, to measure the particle size of the metal inclusions have been identified on the basis of the data of the emission spectrum intensity and a calibration curve prepared and.
机译:在主电子探针微分析仪中测量金属夹杂物的粒径,根据测得的金属夹杂物中金属夹杂物的粒径和校正曲线,显示在主表面上任何位置的φ5mm区域。基于测量样品表面的发光点中存在的元素的发射光谱强度的数​​据,金属夹杂物的粒径与构成固定物体的元素的发射光谱强度之间的关系,确定基于发射光谱强度的数​​据和制备的校准曲线,已经确定了存在于发光点中的金属夹杂物,以测量金属夹杂物的粒径。

著录项

  • 公开/公告号JPWO2002071036A1

    专利类型

  • 公开/公告日2004-07-02

    原文格式PDF

  • 申请/专利权人 日本精工株式会社;

    申请/专利号JP20020569907

  • 发明设计人 長沢 度;

    申请日2002-03-06

  • 分类号G01N15/02;G01N21/67;G01N33/20;

  • 国家 JP

  • 入库时间 2022-08-21 23:24:36

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