Ionizing dose hardness assurance technique for CMOS integrated circuits
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机译:CMOS集成电路的电离剂量硬度保证技术
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摘要
A method for testing IC devices for radiation hardness in a non-destructive manner, comprising subjecting a device under test (DUT) originally in an insensitized state, to a state in which the DUT is more sensitive to adverse effects of ionizing dose radiation and while the DUT is in the more sensitive state, subjecting the DUT to a low level of ionizing radiation to degrade performance of the DUT and electrical testing followed by a restoration of the DUT to its original insensitized state.
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