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Device and method for controlling the interaction of a tip and a sample, notably for atomic force microscopy and nano-indentation
Device and method for controlling the interaction of a tip and a sample, notably for atomic force microscopy and nano-indentation
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机译：用于控制尖端与样品相互作用的装置和方法，特别是用于原子力显微镜和纳米压痕的装置和方法
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摘要
A device for controlling the interaction of a tip and a sample includes a deformable element carrying the tip and means for positioning the tip with respect to the sample. The device also includes at lest two electrodes for creating an electrical field that exerts a force. The deformable element is preferably elastically deformable and includes advantageously a cantilever. According to a method for controlling the interaction of a tip and a sample, the tip carried by a deformable element is positioned with respect to the sample and the interaction of the tip and the sample is controlled by creating an electric field using a voltage between at least two electrodes. This electrical field exerts a force on the tip. Applications are to atomic force microscopy (AFM) and to nano-indentation measurements.
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