首页> 外国专利> Design validation method for integrated system chip circuit, involves validating entire design using simulation test banks of complete system chip and execution of application

Design validation method for integrated system chip circuit, involves validating entire design using simulation test banks of complete system chip and execution of application

机译:集成系统芯片电路的设计验证方法,包括使用完整系统芯片的仿真测试库验证整个设计并执行应用程序

摘要

Interfaces between individual modules, chip internal buses of modules and connection logic are verified by simulation test banks designed by system chip development engineer and using user programmable gate array or emulation of logic. Time control of module at various critical path level is verified and entire design is validated by simulation test banks of complete system chip and application execution. An Independent claim is also included for integrated system chip circuit.
机译:各个模块之间的接口,模块的芯片内部总线和连接逻辑之间的接口由系统芯片开发工程师设计的仿真测试库并使用用户可编程门阵列或逻辑仿真进行验证。验证了模块在各种关键路径级别的时间控制,并通过完整系统芯片和应用程序执行的仿真测试库来验证整个设计。集成系统芯片电路也包括独立权利要求。

著录项

  • 公开/公告号DE10053207A1

    专利类型

  • 公开/公告日2001-05-03

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP. TOKIO/TOKYO;

    申请/专利号DE2000153207

  • 发明设计人 RAJSUMAN ROCHIT;YAMOTO HIROAKI;

    申请日2000-10-26

  • 分类号G06F17/50;G01R31/3181;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:41

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