首页> 外国专利> FORMATION MEASURING METHOD AND FORMATION CONTROL METHOD AND APPARATUS FOR USING SAID FORMATION MEASURING METHOD

FORMATION MEASURING METHOD AND FORMATION CONTROL METHOD AND APPARATUS FOR USING SAID FORMATION MEASURING METHOD

机译:所说的成层测量方法的成层测量方法,成层控制方法和装置

摘要

The present invention is directed to a formation measuring methodand a formation control method and apparatus using the formationmeasuring method in which image by light emitted from light source andtransmitted through a predetermined area of paper is caught by a camerato be displayed as transmitted light image on a display of an imageprocessing computing element, the transmitted light image displayed onthe display being image-analyzed to obtain formation factor forquantification of the formation, J/W ratio and the like being optimizedby fuzzy control using membership functions based on said formationfactor so as to improve the formation.
机译:本发明针对地层测量方法以及使用该地层的地层控制方法和设备测量方法,其中光源发出的光产生图像,并且通过预定区域传输的光被相机捕获在图像显示器上显示为透射光图像处理计算元件,将透射光图像显示在对显示器进行图像分析,以获得用于地层定量,J / W比等得到优化基于隶属度的隶属函数的模糊控制因素,以改善形成。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号