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Method for testing a memory chip subdivided into cell fields while a computer is in operation while observing real-time conditions

机译:在观察实时状况的同时在计算机运行时测试细分为单元字段的存储芯片的方法

摘要

The method involves testing a memory chip which is subdivided in cells (ZF) which are arranged in a matrix of line areas (ZB) and column areas (SB). A first line area is selected, and if the contents of this line area are used by an application program, the contents are copied into a free second line area, and an addressing of the application program is modified accordingly. A Franklin-test is executed for all cells (ZF) of the first line area. Two cells of the line area are selected, and a Nair-test is performed on an arbitrary cell line (ZZ) of both selected cells. The Nair-test is repeated with another pair of cells, until all possible combinations of cell pairs are tested. A Nair test is performed on an arbitrary cell column, limited to the selected first line area, and the entire process is first executed for all line areas of the memory chip, and then for all respective column areas.
机译:该方法包括测试存储芯片,该存储芯片细分为以行区域(ZB)和列区域(SB)的矩阵排列的单元(ZF)。选择第一行区域,并且如果该行区域的内容被应用程序使用,则将内容复制到空闲的第二行区域中,并相应地修改应用程序的地址。对第一行区域的所有像元(ZF)执行富兰克林测试。选择行区域的两个单元,并对两个选定单元的任意单元线(ZZ)进行Nair测试。对另一对电池重复Nair测试,直到测试了所有可能的电池对组合。对限于选定的第一行区域的任意单元列执行Nair测试,然后首先对存储芯片的所有行区域执行整个过程,然后对所有相应的列区域执行整个过程。

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