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Method of identifying antenna-mode scattering centers in arrays from planar near field measurements

机译:从平面近场测量中识别阵列中天线模式散射中心的方法

摘要

A method of identifying antenna-mode scattering centers in an aperture device or array from planar near field measurements. Antenna- mode scattering centers may be determined for aperture assemblies, phenomenological models of apertures, and antenna arrays comprising a feed and an array of antenna elements. The method uses a scanning probe and receiver for making near field measurements. A feed horn and signal source illuminates the device. An absorber is disposed between the device and the probe and this combination is illuminated. A first set of data is collected over a planar surface in a near field region of the device. The device is then illuminated with the absorber removed. A second set of data is collected over a planar surface in a near field region of the device. The difference between the first and second sets of data is determined to provide data indicative of the near field response of the probe to the near field scattered from the device. Data indicative of the scattered far field from the device is computed using a planar near-to- far-field transform. The computed far field data is then converted from probe coordinates to device coordinates. The converted far field data is equated to data corresponding to the far field of an array device whose excitation weights are a product of a reflection coefficient looking into the feed at a junction between an antenna element and the feed, and a horn-element coupling factor between the feed horn and an antenna element that is proportional to power received by an individual antenna element from the feed horn. A copolarized component of the far field is divided by a copolarized component of an embedded element pattern to produce a scalar array pattern. The excitation weights are determined using an inverse fast Fourier transform (FFT) of the scalar array pattern. The reflection coefficients are determined by dividing the excitation weights by the horn-element coupling factor. Finally the antenna-mode scattered far field may be computed for an arbitrary incident plane wave having the predetermined angle of arrival and polarization at a predetermined frequency, which antenna-mode scattered far field is indicative of the antenna-mode scattering centers in the device.
机译:一种从平面近场测量中识别孔径设备或阵列中天线模式散射中心的方法。可以为孔组件,孔的现象学模型以及包括馈源和天线元件阵列的天线阵列确定天线模式散射中心。该方法使用扫描探针和接收器进行近场测量。馈电喇叭和信号源照亮设备。吸收器设置在设备和探头之间,并且该组合被照亮。在设备的近场区域中的平坦表面上收集第一组数据。然后在移除吸收体的情况下照亮设备。在设备的近场区域中的平坦表面上收集第二组数据。确定第一组数据和第二组数据之间的差异,以提供指示探针对从设备散射的近场的近场响应的数据。使用平面近场到远场变换来计算表示来自设备的散射远场的数据。然后将计算出的远场数据从探针坐标转换为设备坐标。转换后的远场数据等于与阵列设备的远场相对应的数据,该阵列设备的激励权重是在天线元件与馈源之间的结点处馈入馈源的反射系数与喇叭元件耦合因子的乘积。在馈电喇叭和天线元件之间的位置,该天线元件与单个天线元件从馈电喇叭所接收的功率成比例。远场的同极化分量被嵌入式元件图案的同极化分量除以产生标量阵列图案。使用标量阵列模式的快速傅里叶逆变换(FFT)确定激励权重。反射系数是通过将激励权重除以角元耦合因子来确定的。最后,可以针对在预定频率下具有预定到达角和极化的任意入射平面波计算天线模式散射远场,该天线模式散射远场表示设备中的天线模式散射中心。

著录项

  • 公开/公告号US5394157A

    专利类型

  • 公开/公告日1995-02-28

    原文格式PDF

  • 申请/专利权人 HUGHES AIRCRAFT COMPANY;

    申请/专利号US19930155320

  • 发明设计人 DAYEL R. GARNESKI;

    申请日1993-11-22

  • 分类号H01Q3/00;

  • 国家 US

  • 入库时间 2022-08-22 04:05:20

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