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Optical system for in-plane strain measurement using electronics speckle pattern interferometry
Optical system for in-plane strain measurement using electronics speckle pattern interferometry
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机译：使用电子散斑图案干涉仪进行面内应变测量的光学系统
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摘要
Electronic speckle pattern interferometric apparatus for the measurement of the displacement of a surface under test comprises a source (10) of coherent radiation, a first curved reflecting surface (11) to reflect radiation from the source on having a curvature of opposite sign from the first curved reflecting surface, and an electro-optic combining device such as a television camera (15) to receive the radiation from the surface under test.
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