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Local frequency filtering for raster electron microscope - scanning each image point twice with different local integration limits
Local frequency filtering for raster electron microscope - scanning each image point twice with different local integration limits
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机译：光栅电子显微镜的局部频率滤波-以不同的局部积分极限扫描每个图像点两次
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摘要
The process is for improving quality of information images, partic. for raster electron microscopes and video cameras. It increases image sharpness, noise suppression, as well as stressing or suppressing certain image structures, and improving the image detail display. Each image point of the original is scanned twice with different local integration limits. From the derived signals the filtered image is computed. Pref., the double scanning is carried out in close succession, without change of the scanning position. In this manner the cost of the appts. for the local frequency filtering is reduced and the image processing periods are shortened. Images in on-line operation are obtained in real time, which is of great importance for, e.g. medical diagnostics in interpretation of X-ray images etc.
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