Electrically conducting specimen holder for scanning electron microscopy - investigations

• 1. 用于固定扫描电子显微镜待测样品的导电橡皮泥的加工方法 [P] . 中国专利： CN106548827B . 2017.10.17
• 2. 用于固定扫描电子显微镜样品的导电橡皮泥的加工方法 [P] . 中国专利： CN106548827A . 2017-03-29
• 3. The production method of scanning electron microscopy SEM for conducting cold mounting specimens [P] . 韩国专利： KR101047215B1 . 2011-07-06

  机译： 进行冷装试样的扫描电子显微镜生产方法。

• 4. SPECIMEN ENCLOSURE ASSEMBLY FOR SCANNING FLUID CONTAINING SPECIMENS VIA SCANNING ELECTRON MICROSCOPY [P] . IL165495A . 2011-01-31

  机译： 通过扫描电子显微镜扫描包含样品的流体的样品外壳组件

• 5. SPECIMEN ENCLOSURE ASSEMBLY FOR SCANNING FLUID CONTAINING SPECIMENS VIA SCANNING ELECTRON MICROSCOPY [P] . IL165495B . 2011-01-31

  机译： 通过扫描电子显微镜扫描包含样品的流体的样品外壳组件

• 1. Investigating microstructure of Longmaxi shale in Shizhu area,Sichuan Basin, by optical microscopy, scanning electron microscopy and micro-computed tomography [J] . Yu Wang, Li-Hua Wang, Jian-Qiang Wang, 核技术（英文版） . 2017,第011期
• 2. A FAST METHOD FOR HOMOGENEOUS DISSOLUTION OF CHALK SPECIMENS FOR LABORATORY EXPERIMENTS – DOCUMENTATION BY X-RAY CTSCANNING AND SCANNING ELECTRON MICROSCOPY [C] . Claus Kjoller, Lykourgos Sigalas, Helle F. Christensen International Symposium of the Society of Core Analysts . 2018
• 3. Scanning current spectroscopy: A conducting probe atomic force microscopy technique for exploring the physical and electronic properties of metal oxide/organic interfaces. [D] . Veneman, Peter Alexander. 2009
• 4. Specimen Holder to Critical-Point Dry Microorganisms for Scanning Electron Microscopy [O] . C. P. Kurtzman, F. L. Baker, M. J. Smiley 1974
• 5. Specimen Holder to Critical-Point Dry Microorganisms for Scanning Electron Microscopy [O] . C. P. Kurtzman, F. L. Baker, M. J. Smiley 1974
• 6. Simple Constant-Magnification Specimen Holder for JEOL JSM-2Scanning Electron Microscope. [R] . maurin, j. k. 2001

• 1. Investigation of Metal Wired Coloured Historical Textile Using Scanning Electron Microscopy and HPLC-DAD [J] . Turkan Yurdun ,Seher Karsli-Ceppioglu ,R. Gurcan Oraltay . 化学与化工 . 2012,第007期
• 2. A MONTE CARLO SIMULATION OF SECONDARY ELECTRON AND BACKSCATTERED ELECTRON IMAGES IN SCANNING ELECTRON MICROSCOPY [J] . H.M.Li Z.J.Ding . 金属学报：英文版 . 2005,第3期
• 3. Evidence of Cu（Ⅱ） Ion Interaction in Crosslinked Chitosan Thin Film from X-Ray Photoelectron Spectroscopy and Field Emission Scanning Electron Microscopy [J] . Yap Wing Fen ,Mat Yunus Wan Mahmood . 材料科学与工程：中英文B版 . 2011,第005期
• 4. Multi-objective Optimal Design of High Frequency Probe for Scanning Ion Conductance Microscopy [J] . GUO Renfei ,ZHUANG Jian ,MA Li . 中国机械工程学报 . 2016,第001期
• 5. 不同形貌复合导电粉体的制备及用于导电涂料的研究 [C] . 胡佩伟 ,杨华明 . 第七届中国功能材料及其应用学术会议 . 2010
• 6. 激光等离子体飞行时间质谱仪用于地质样品和人发样品直接分析中的研究 [A] . 童庆国 . 2009