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首页> 外文学位 >Scanning current spectroscopy: A conducting probe atomic force microscopy technique for exploring the physical and electronic properties of metal oxide/organic interfaces.
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Scanning current spectroscopy: A conducting probe atomic force microscopy technique for exploring the physical and electronic properties of metal oxide/organic interfaces.

机译：扫描电流光谱法：一种传导探针原子力显微镜技术，用于探索金属氧化物/有机界面的物理和电子性质。

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摘要

Organic photovoltaics (OPVs) offer the prospect of inexpensive processing compared with conventional crystalline semiconductor cells. These cells are still lower in efficiency than their inorganic counterparts, in part because a detailed understanding of the role that interfaces play in these devices is lacking. The electronic properties of the surface of the common transparent electrode Indium:Tin Oxide (ITO) have been studied both on a macroscopic and nanoscopic scale, and the interface between ITO and organic materials has been studied on a macroscopic scale as well. Little work has been done on the nanoscopic properties of the ITO/organic interface. This dissertation introduces a new conducting-probe atomic force microscope (CP-AFM) technique, Scanning Current Spectroscopy (SCS), for probing the nanoscopic lateral variation in the electronic properties of this interface, and demonstrates its utility by examining the ITO/copper phthalocyanine (CuPc) interface. SCS demonstrates large lateral variations in the hole collection efficiency at that interface on a nanometer length scale, and that the distribution of these variations is affected by ITO pretreatment. Measurements on OPVs demonstrate that the performance of these devices is dependant on the nanoscopic lateral variation in surface properties that SCS measures, and that in the case of the ITO/CuPc interface SCS explains the observed device behavior better than techniques that yield macroscopic average electronic properties, such as photoelectron spectroscopy.;Additionally, this dissertation discusses advances made in the design of an integrated optical refractive index sensor. The sensor uses organic light-emitting diodes (OLEDs) and OPVs as integrated light-sources and detectors on top of a slab waveguide substrate. The platform offers potentially high sensitivities to refractive index changes (and the selective binding of chemical and biological analytes), and is amenable to large scale integration for on-chip multiplexed detection. The refractive index response has been demonstrated previously, but the performance was limited by electrical noise and OLED drift. The use of different absorbing species in the OPV, integration of multiple sensors on a single substrate, addition of a reference channel to monitor OLED drift and the use of lock-in amplification for signal processing allow the sensor to detect changes of 10-4 refractive index units.
机译：与传统的晶体半导体电池相比，有机光伏（OPV）提供了廉价的加工前景。这些电池的效率仍然低于无机电池，部分原因是缺乏对接口在这些设备中所起的作用的详细了解。在宏观和纳米尺度上研究了普通透明电极铟：氧化锡（ITO）表面的电子性质，并且也在宏观尺度上研究了ITO和有机材料之间的界面。在ITO /有机界面的纳米性能方面所做的工作很少。本文介绍了一种新的导电探针原子力显微镜（CP-AFM）技术，即扫描电流光谱法（SCS），用于探测该界面的电子性质的纳米横向变化，并通过研究ITO /铜酞菁来证明其实用性。 （CuPc）接口。 SCS在纳米级尺度上显示了该界面处空穴收集效率的较大横向变化，并且这些变化的分布受ITO预处理的影响。对OPV的测量表明，这些器件的性能取决于SCS测量的表面性能的纳米级横向变化，并且在ITO / CuPc界面的情况下，SCS比产生宏观平均电子性能的技术更好地解释了观察到的器件性能此外，本论文还讨论了集成光学折射率传感器的设计进展。该传感器使用有机发光二极管（OLED）和OPV作为平板式波导基板顶部的集成光源和检测器。该平台对折射率变化（以及化学和生物分析物的选择性结合）具有潜在的高灵敏度，并且适合大规模集成用于片上多路检测。先前已经证明了折射率响应，但是性能受到电噪声和OLED漂移的限制。在OPV中使用不同的吸收物质，在单个基板上集成多个传感器，添加参考通道以监视OLED漂移以及在信号处理中使用锁定放大功能，使传感器可以检测10-4屈光度的变化索引单位。

著录项

  • 作者

    Veneman, Peter Alexander.;

  • 作者单位

    The University of Arizona.;

  • 授予单位 The University of Arizona.;
  • 学科 Chemistry Analytical.
  • 学位 Ph.D.
  • 年度 2009
  • 页码 259 p.
  • 总页数 259
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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