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Semiconductor matrix of photoemitter elements prodn. - by ion implantation of zinc in gallium arsenide structure and diffusion tempering

机译:光电发射元件的半导体矩阵-通过离子注入砷化镓结构中的锌并进行扩散回火

摘要

In the prodn. of a semiconductor matrix of photoemitter elements based on an epitaxial structure of a p+ - GaAs substrate with cons4cutive p-Ga1-xAlxAs- and n-Ga1-yAly-As- layers forming a photoemitting pn-junction, by producing a mask in the n-layer, introducing an acceptor through the former into the n-layer and diffusion tempering for a time and at a temp. sufficient to produce p-zones in the n layer having an penetration depth at least equal to the thickness of the n-layer, the mask is produced by applying a photoresist coating to the n-layer, followed by exposure and etching, and the acceptor is introduced by ion implantation and, before diffusion tempering, the photoresist coating is removed and a SiO2 coating is applied to the n-layer. The process extends the useful range of the matrix and is also more economical. It is not necessary to use a dielectric Al2O3 coating, introduction of Zn and diffusion tempering in an ampoule. Photoemitter elements with linear dimensions of under 70-100 mu m can be produced.
机译:在产品中通过在n中制造掩模,基于具有连续p-Ga1-xAlxAs-和n-Ga1-yAly-As-层的p +-GaAs衬底的外延结构,形成光发射pn结的光电发射元件的半导体矩阵层,通过前者将受体引入n层,并在一定温度下进行一定时间的扩散回火。足以在穿透深度至少等于n层厚度的n层中产生p区,通过在n层上施加光致抗蚀剂涂层,然后进行曝光和蚀刻,以及接受体来制造掩模通过离子注入引入SiO 2涂层,并且在扩散回火之前,去除光致抗蚀剂涂层并且将SiO 2涂层施加至n层。该方法扩展了基质的有用范围,而且更经济。不需要使用介电的Al2O3涂层,Zn的引入和安瓿瓶中的扩散回火。可以生产线性尺寸在70-100微米以下的光发射元件。

著录项

  • 公开/公告号DE2527074B2

    专利类型

  • 公开/公告日1978-10-12

    原文格式PDF

  • 申请/专利权人 AKIMOV JURY STEPANOVITSCH;

    申请/专利号DE19752527074

  • 发明设计人 AKIMOV JURY STEPANOVITSCH;

    申请日1975-06-18

  • 分类号H01L33/00;

  • 国家 DE

  • 入库时间 2022-08-22 22:03:50

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