首页> 外国专利> procedures for the introduction of a leitfaehigkeitstyp awarding fremdstoffatomen in the crystalline lattice of a semiconductor material

procedures for the introduction of a leitfaehigkeitstyp awarding fremdstoffatomen in the crystalline lattice of a semiconductor material

机译:在半导体材料的晶格中引入颁授fremdstoffatomen的leitfaehigkeitstyp的步骤

摘要

PICT:0999296/C1/1 Doped semi-conductor material is prepared by deposition on to the same semi-conductor material from a mixture of a gaseous compound of the semi-conductor, the dopant and a carrier gas, part of the stream of carrier gas being diverted before mixing with the semi-conductor compound, to pass over the doping material in solid form. In the Figure, part of the hydrogen stream from source 9 is passed over solid phosphorus pentachloride in chamber 10 maintained at a constant temperature by bath 11. Another part of the hydrogen stream is passed through a thermally decomposable source 6 of silicon such as silico-chloroform, and the two streams are reassociated and passed into reaction chamber 20 which contains electrically heated silicon rods 24 upon which silicon containing phosphorus is deposited. By control of rates of flow and the temperature of the solid deposit source, the impurity concentration can be accurately controlled. Antimony trichloride, arsenic pentachloride, decaborane are described as alternative sources of dopant.
机译:通过将一部分气体的气态化合物,掺杂剂和载气的混合物沉积到同一半导体材料上来制备掺杂的半导体材料载气在与半导体化合物混合之前被转移,以固体形式越过掺杂材料。在该图中,来自源9的一部分氢气流通过浴11保持在恒定温度的室10中,经过固态五氯化磷,另一部分氢气流经可热分解的硅源6,例如硅再用氯仿将这两种物流重新结合,并送入反应室20,该反应室包含电加热的硅棒24,在该硅棒上沉积含磷的硅。通过控制流速和固体沉积源的温度,可以精确地控制杂质浓度。三氯化锑,五氯化砷,十硼烷被描述为掺杂剂的替代来源。

著录项

  • 公开/公告号DE000001444507A

    专利类型

  • 公开/公告日1968-10-24

    原文格式PDF

  • 申请/专利权人 MERCK & CO INC;

    申请/专利号DE1444507A

  • 申请日1962-04-18

  • 分类号B01J17/40;

  • 国家 DE

  • 入库时间 2022-08-23 13:16:10

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