首页> 外国专利> Scattering Measurement Analysis Method, Scattering Measurement Analysis Device, And Non-Transitory Computer-Readable Storage Medium Storing Scattering Measurement Analysis Program

Scattering Measurement Analysis Method, Scattering Measurement Analysis Device, And Non-Transitory Computer-Readable Storage Medium Storing Scattering Measurement Analysis Program

机译:散射测量分析方法,散射测量分析装置和非暂时性计算机可读存储介质存储散射测量分析程序

摘要

Provided is a scattering measurement analysis method including obtaining a theoretical scattering intensity from a structural model that contains a lot of scatterers, wherein the obtaining of a theoretical scattering intensity includes obtaining a contribution to the theoretical scattering intensity of a pair of a scatterer “m” and a scatterer “n” existing at a distance “r” from the scatterer “m” among a plurality of scatterers by at least one of calculations in accordance with the distance “r”, the calculations including a first calculation of calculating contributions of the scatterer “m” and the scatterer “n” from respective scattering factors fm(q) and fn*(q) and a center-to-center distance rmn between the scatterer “m” and the scatterer “n”, and a second calculation of substituting the scattering factor fn*(q) of the scatterer “n” by a first representative value and substituting a probability density function of the number of scatterers existing at the distance “r” by a constant value.
机译:提供了一种散射测量分析方法,包括从包含许多散射体的结构模型获得理论散射强度,其中理论散射强度的获得包括对散射体“M”的一对散射强度的贡献获得贡献并且通过根据距离“R”的计算中的至少一个,从散射体中的散射体“M”中的散射体“n”存在于多个散射体中的距离“r”,包括第一计算计算贡献的第一计算的计算散射仪“M”和各自散射因子F M (Q)和F N *(Q)和中心到中心距离R <散射体“M”和散射体“n”之间的亚> Mn ,并将散射因子F n *(q)用a代替散射因子f *(q)。第一代表值并代替散射体数量的概率密度函数通过恒定值存在于距离“R”。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号