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Antenna array test circuit, method for testing phased antenna array, and phased array array
Antenna array test circuit, method for testing phased antenna array, and phased array array
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机译：天线阵列测试电路，测试分阶段天线阵列的方法和相控阵列数组
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摘要
To provide a technique that improves phased antenna array testing speed to thereby enable a compact and efficient implementation to be obtained.SOLUTION: An antenna array testing circuit 200 can include a circuitry including a plurality of memory registers, a testing sequence generation logic, and a testing control logic. The memory registers can store, for each antenna element of a plurality of antenna elements of the phased antenna array, a corresponding antenna element ID. The memory registers can store a testing step ID indicative of a testing step of a sequence of testing steps. The testing sequence generation logic can determine, for each antenna element of the phased antenna array, a corresponding testing signal indicative of a testing state of the antenna element during the testing step, using the corresponding antenna element ID and the testing step ID. The testing control logic can cause each antenna element of the phased antenna array to be configured according to the corresponding testing signal during the testing step.SELECTED DRAWING: Figure 2
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