Method for automated unsupervised ontological investigation of structural appearances in electron micrographs

• 1. METHOD FOR AUTOMATED UNSUPERVISED ONTOLOGICAL INVESTIGATION OF STRUCTURAL APPEARANCES IN ELECTRON MICROGRAPHS [P] . US2021286969A1 . 2021-09-16

  机译： 电子显微照片中结构外观的自动化无监督本体主义的方法

• 2. METHOD FOR AUTOMATED UNSUPERVISED ONTOLOGICAL INVESTIGATION OF STRUCTURAL APPEARANCES IN ELECTRON MICROGRAPHS [P] . ZA201901125B . 2020-03-25

  机译： 电子显微图像中结构外观的自动无监督本体检查方法

• 3. Method for Automated Unsupervised Ontological Investigation of Structural Appearance in Electron Micrographs [P] . 韩国专利： KR20200015438A . 2020-02-12

  机译： 电子显微照片中结构外观的自动无监督本体研究方法

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