首页> 外文会议>2003 TAPPI spring technical conference and exhibit >NEW OPTIMIZATION OF CD CONTROL FOR GLOBAL AND LOCALIZED PROFILE PERFORMANCE
【24h】

NEW OPTIMIZATION OF CD CONTROL FOR GLOBAL AND LOCALIZED PROFILE PERFORMANCE

机译:全局和局部配置文件性能的CD控制的新优化

获取原文
获取原文并翻译 | 示例

摘要

Achieving a uniform profile is the goal of every cross direction (CD) control application. A critical factor to reachrnthat goal is the accurate spatial alignment of CD actuators with their corresponding responses on the measuredrnprofile. In a typical process, the actual CD alignment often changes with process conditions. As a result, profilesrndegrade either locally or globally if CD actuators are misaligned with their measured profiles in a CD control. Arnnew technique for quickly detecting profile degradation and effectively optimizing CD control is presented. Thernresult of this new optimization technique is demonstrated with the result obtained from a mill application.
机译:实现统一的轮廓是每个横向(CD)控制应用程序的目标。达到该目标的关键因素是CD执行器的精确空间对准及其在测量轮廓上的相应响应。在典型的过程中,实际CD对齐通常会随过程条件而变化。结果,如果CD执行器与CD控件中的测量轮廓未对齐,则轮廓会局部或全局降级。提出了一种Arnnew技术,用于快速检测轮廓退化并有效优化CD控制。从工厂应用获得的结果证明了这种新的优化技术的结果。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号