首页> 外文会议>2012 IEEE 9th International Conference on Group IV Photonics. >High-uniformity waveguide-integrated metal-semiconductor-metal germanium photodetector with sige capping layer and its application to differential receivers
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High-uniformity waveguide-integrated metal-semiconductor-metal germanium photodetector with sige capping layer and its application to differential receivers

机译:具有均匀覆盖层的高均匀度波导集成金属-半导体-金属锗光电探测器及其在差分接收机中的应用

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摘要

Differential pairs of metal-semiconductor-metal (MSM) germanium (Ge) photodetectors (PDs) with an epitaxially-tuned silicon germanium (SiGe) capping layer are fabricated. PDs with high responsivity (1.0 A/W) and low dark current (33 mA/cm2) are obtained, and low-noise characteristics and 10 Gbps data transmission is confirmed in the differential MSM PDs.
机译:制作了具有外延调谐的硅锗(SiGe)覆盖层的金属-半导体-金属(MSM)锗(Ge)光电探测器(PD)的差分对。获得了具有高响应度(1.0 A / W)和低暗电流(33 mA / cm 2 )的PD,并在差分MSM PD中确定了低噪声特性和10 Gbps数据传输。

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