首页> 外文会议>2017 32nd Symposium on Microelectronics Technology and Devices >Self-heating-based analysis of gate structures on junctionless nanowire transistors
【24h】

Self-heating-based analysis of gate structures on junctionless nanowire transistors

机译:基于自加热的无结纳米线晶体管上栅极结构的分析

获取原文
获取原文并翻译 | 示例

摘要

In this paper, an analysis on the thermal profile of Junctionless Nanowire Transistors is made, where self-heating effects are evaluated in devices with a large 4-contact gate, comparing the results with a minimized gate structure device. Tests are performed for different fin widths and fin heights. The analysis is based on three-dimensional simulations. Results showed that the gate structure is impactful to the thermal behavior of narrow small transistors, but not wide and tall ones.
机译:在本文中,对无结纳米线晶体管的热特性进行了分析,其中在具有大4触点栅极的器件中评估了自发热效应,并将结果与​​最小化的栅极结构器件进行了比较。针对不同的鳍片宽度和鳍片高度进行测试。该分析基于三维模拟。结果表明,栅极结构对窄小晶体管的热性能有影响,但对宽高晶体管却没有影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号