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首页> 外文会议>21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems >Tuning Stochastic Space Compaction to Faster-than-at-Speed Test
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Tuning Stochastic Space Compaction to Faster-than-at-Speed Test

机译：调整随机空间压缩以加快测试速度

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Small delay faults on short paths may be undetectable even during at-speed test. Faster-than-at-speed test (FAST) targets these hidden delay faults by overclocking the circuit, typically using several different test frequencies. Due to the shorter clock periods, the output values on long paths may not stabilize fast enough, and the resulting unknown values (X-values) aggravate test response compaction. As the number and the distribution of X-values vary with the test frequency, X-handling for FAST must be very flexible. Most of the state-of-the-art approaches for X-tolerant test response compaction are not designed for varying X-profiles. Yet, the stochastic compactor by Mitra et al. offers an easily programmable solution, as the com¬paction logic is controlled by weighted pseudo-random signals. An optimal setup, however, cannot be guaranteed in a FAST scenario. To better adapt the scheme to FAST, the compactor is partitioned into several smaller compactors and the scan outputs are properly assigned to compactor inputs. Finding the best setup then corresponds to a clustering problem, for which several algorithms are presented. Experimental results show that the number of X-values at the compactor outputs can be significantly reduced while maintaining the fault efficiency.
机译：即使在全速测试期间，短路径上的小延迟故障也可能无法检测到。速度超速测试（FAST）通常通过使用几种不同的测试频率对电路进行超频来针对这些隐藏的延迟故障。由于较短的时钟周期，长路径上的输出值可能无法足够快地稳定下来，并且所产生的未知值（X值）加剧了测试响应的紧凑性。由于X值的数量和分布随测试频率而变化，因此FAST的X处理必须非常灵活。大多数用于X容忍的测试响应压缩的最新方法都不是针对变化的X轮廓而设计的。然而，Mitra等人的随机压实机。由于压缩逻辑由加权伪随机信号控制，因此提供了一种易于编程的解决方案。但是，不能在FAST方案中保证最佳设置。为了使该方案更好地适应FAST，将压缩器划分为几个较小的压缩器，并将扫描输出正确分配给压缩器输入。然后，找到最佳设置对应于一个聚类问题，针对此问题提出了几种算法。实验结果表明，在保持故障效率的同时，可以显着减少压实机输出的X值数量。

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