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THE LINE OVERLAP CORRECTION BY THEORETICAL INTENSITY

机译:用理论强度校正线重叠

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摘要

It is known that line overlap correction is very important in x-ray spectrometry. There are thernconventional overlap correction methods using measured intensities and concentrations ofrninterfering elements. However, there are applications to which methods cannot to be applied in thernanalyses of multi-layer thin films. The overlap correction method using theoretical intensity ofrninterfering elements has been established in this study and this correction is effective even whenrnthe wavelengths of the analyzing line and the interfering line are very close to each other. And thisrncorrection method has also been adapted for standard less analysis.
机译:众所周知,线重叠校正在X射线光谱学中非常重要。有常规的重叠校正方法,其使用测得的干扰元素的强度和浓度。然而,在多层薄膜的分析中,存在无法应用方法的应用。在这项研究中,已经建立了使用干扰元素的理论强度的重叠校正方法,即使在分析线和干扰线的波长彼此非常接近的情况下,这种校正也是有效的。而且,这种校正方法也适用于较少标准的分析。

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  • 来源
  • 会议地点 Steamboat Springs CO(US);Steamboat Springs CO(US);Steamboat Springs CO(US)
  • 作者单位

    Rigaku Industrial Corporation, Akaoji-cho 14-8, Takatsuki, Osaka 569-1146, Japan;

    rnRigaku Industrial Corporation, Akaoji-cho 14-8, Takatsuki, Osaka 569-1146, Japan;

    rnRigaku Industrial Corporation, Akaoji-cho 14-8, Takatsuki, Osaka 569-1146, Japan;

    rnRigaku Industrial Corporation, Akaoji-cho 14-8, Takatsuki, Osaka 569-1146, Japan;

    rnRigaku/MSC, 9009 New Trails Drive, The Woodlands, TX 77381-5209, USA;

    rnRigaku/MSC, 9009 New Trails Drive, The Woodlands, TX 77381-5209, USA;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 X射线、紫外线、红外线;
  • 关键词

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