Slit-scanning microscope with a high NA objective lens for analysis of synaptic function

机译：带高NA物镜的狭缝扫描显微镜用于分析突触功能

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By employing the total internal reflection fluorescence (TIRF) microscope with an ultra high NA (1.65) objective lens, we demonstrated detailed dynamics of exocytosis in various types of secretory vesicles. However, the TIRF microscopy could be applied to observations only on the plasma membrane and its immediate vicinity. To observe the vesicles in the deeper region of cytoplasm, we modified the TIRF optics to project a slit beam thinner than 1 μm in width to the cell. The slit beam illumination spotted single secretory vesicles inside the cell better and their movement and exocytosis easier. By scanning the slit beam, a fluorescence microscopy was possible at a high signal-to-noise ratio useful for measurement and analysis of single exocytosis in neurons and endocrine cells.

机译：通过使用具有超高NA（1.65）物镜的全内反射荧光（TIRF）显微镜，我们证明了各种类型的分泌性囊泡中胞吐作用的详细动态。但是，TIRF显微镜只能用于质膜及其附近区域的观察。为了观察细胞质较深区域的囊泡，我们对TIRF光学器件进行了改进，以将宽度小于1μm的裂隙光束投射到细胞上。裂隙光束照射可以更好地发现细胞内的单个分泌小囊泡，它们的运动和胞吐作用也更容易。通过扫描狭缝光束，可以以高信噪比进行荧光显微镜检查，可用于测量和分析神经元和内分泌细胞中的单胞吐作用。

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来源
《Conference on Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues II; 20040127-20040128; San Jose,CA; US》|2004年|P.108-113|共6页
会议地点 San Jose CA(US)
作者
Takashi Sakurai; Yoshihiko Wakazono; Seiji Yamamoto; Susumu Terakawa;
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作者单位

Photon Medical Research Center, Hamamatsu Univ. Sch. of Medicine, Hamamatsu 431-3192, Japan;

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会议组织
原文格式 PDF
正文语种 eng
中图分类光、激光生物医学;
关键词
slit-scannning fluorescence (SSF) microscopy; total internal reflection fluorescence (TIRF) microscopy; exocytosis; synaptic vesicle; insulin;

机译：缝隙扫描荧光（SSF）显微镜;全内反射荧光（TIRF）显微镜;胞吐作用;突触囊泡;胰岛素;

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机译：45.5x无限校正Schwarzschild显微镜物镜设计：使用Zemax的光学性能评估和公差分析
2. Analysis of chromatic aberration of single objective lens and correction of that of a NA=0.85 objective lens [J] . Fumihiko Ito, Makoto Itonaga, Toshiya Saito 電子情報通信学会技術研究報告. 電子部品·材料. Component Parts and Materials . 2003,第316期

机译：单物镜的色差分析和NA = 0.85物镜的色差校正
3. Analysis of chromatic aberration of single objective lens and correction of that of a NA=0.85 objective lens [J] . Fumihiko Ito, Makoto Itonaga, Toshiya Saito 電子情報通信学会技術研究報告. 電子部品·材料. Component Parts and Materials . 2003,第316期

机译：单物镜镜片色差分析，NA = 0.85物镜的校正校正
4. Slit-scanning microscope with a high NA objective lens for analysis of synaptic function [C] . Takashi Sakurai, Yoshihiko Wakazono, Seiji Yamamoto, Conference on imaging, manipulation, and analysis of biomolecules, cells, and tissues . 2004

机译：扫描扫描显微镜具有高NA物镜，用于分析突触功能
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8. IN-SITU MEASUREMENT OF OBJECTIVE LENS DATA OF A HIGH-RESOLUTION ELECTRON MICROSCOPE [R] . Klaus Heinemann 1971

机译：现场测量高分辨率电子显微镜的目标透镜数据

Slit-scanning microscope with a high NA objective lens for analysis of synaptic function

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