首页> 外文会议>Current developments in lens design and optical engineering XII; and Advances in thin film coatings VII >The research of relationships between residual stress and columnar angles in oblique deposition of magnesium fluoride thin films
【24h】

The research of relationships between residual stress and columnar angles in oblique deposition of magnesium fluoride thin films

机译:氟化镁薄膜斜向沉积中残余应力与柱状角关系的研究

获取原文
获取原文并翻译 | 示例

摘要

MgF_2 films are obliquely deposited on glass substrates using a resistive heating Mo boat at two substrate temperatures -room temperature and 220 ℃. All films clearly have columnar microstructures, as determined by SEM. The columnar angle of the MgF_2 films increases with the deposition angle. However, the columnar angle of the MgF_2 film that was deposited at a substrate temperature of room temperature does not equal that at 220 ℃ when the MgF_2 film was prepared at the same deposition angle. Also, the trend behavior of the stress of the MgF_2 films that are deposited at a substrate temperature of room temperature differs from that of those deposited at 220 ℃ because of the formation of thermal stress. The behaviors that are associated with stress in the MgF_2 films are measured using a phase-shifting Twyman-Green interferometer and a phase reduction algorithm is applied. Anisotropic stress does not develop in the MgF_2 films with tilted columns and the residual stress depends on the deposition and columnar angles of the microstructures of the MgF_2 films.
机译:使用电阻加热Mo舟在两个基板温度(室温和220℃)下将MgF_2薄膜倾斜沉积在玻璃基板上。通过SEM确定,所有膜显然具有柱状微结构。 MgF_2膜的柱状角随沉积角而增加。然而,当以相同的沉积角制备MgF_2膜时,在室温的基板温度下沉积的MgF_2膜的柱状角不等于在220℃时的柱状角。而且,由于形成了热应力,在室温的基板温度下沉积的MgF_2膜的应力的趋势行为与在220℃下沉积的MgF_2膜的应力的趋势行为不同。使用相移Twyman-Green干涉仪测量与MgF_2膜中的应力相关的行为,并应用相减算法。带有倾斜柱的MgF_2膜不会产生各向异性应力,残余应力取决于MgF_2膜的微观结构的沉积和柱状角。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号