Institute of Applied Mechanics Biomedical Engineering, Taiyuan University of TechnologyNo.79 West Yingze Street, Taiyuan, 030024, Shanxi, China College of Civil Engineering and Architecture, Hebei UniversityNo.180 Wusi East Road, Baoding, 071002,H;
Institute of Applied Mechanics Biomedical Engineering, Taiyuan University of TechnologyNo.79 West Yingze Street, Taiyuan, 030024, Shanxi, China;
Institute of Applied Mechanics Biomedical Engineering, Taiyuan University of TechnologyNo.79 West Yingze Street, Taiyuan, 030024, Shanxi, China;
Institute of Applied Mechanics Biomedical Engineering, Taiyuan University of Technology No.79 West Yingze Street, Taiyuan, 030024, Shanxi, China;
机译:QFN和PowerQFN封装的全面板级焊点可靠性建模和测试
机译:电信应用的TFBGA封装的板级焊点可靠性建模和测试
机译:板级跌落测试下的动态响应和焊点可靠性
机译:基于动态构成关系与热效应模拟VFBGA包装焊接焊接接头可靠性
机译:使用BGA封装的焊点可靠性评估:Megtron 6与FR4印刷电路板的跌落测试
机译:在长期老化和循环下的板级热测试中ENIG和ENEPIG表面处理的包装可靠性影响
机译:基于印刷线路板表面菌株的BGA包装中焊点可靠性的影响评价。