Loss measurement for SCF materials

机译：SCF材料的损耗测量

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Abstract: Accurate measurement of the optical loss of SCF is helpful to selecting high quality SCF and determining optimal growth conditions. By means of the SCF optic characteristic measurement set which made by ourselves, we have measured absorption spectra, fluorescence spectra and positional scatter spectra of Al$-2$/O$-3$/, Nd:YAG and other kinds of fibers, and some important factors which cause scattering loss have been researched. These factors include undulation of diameter, microdefects and surface wrappers of the fiber. In addition, the control of the growth conditions and improvement of the fiber qualities are mentioned.!7

机译：摘要：准确测量SCF的光损耗有助于选择高质量的SCF并确定最佳生长条件。通过我们自己制作的SCF光学特性测量装置，我们测量了Al $ -2 $ / O $ -3 $ /，Nd：YAG和其他类型纤维的吸收光谱，荧光光谱和位置散射光谱，以及研究了引起散射损失的一些重要因素。这些因素包括纤维的直径起伏，微缺陷和表面包裹物。此外，还提到了生长条件的控制和纤维品质的改善。！7

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来源
《Fiber Optic Materials and Components》|1994年|p.378-386|共9页
会议地点 San Diego CA(US);San Diego CA(US)
作者
Mianyu Dong; Zhejiang Univ.; Hangzhou; China; Limin Tong; Zhejiang Univ.; Hangzhou; China; Zu-chang Ding; Zhejiang Univ.; Hangzhou; China.;
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正文语种 eng
中图分类一般工业技术;
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2. Explicit Permittivity Determination of Medium-Loss Materials From Calibration-Independent Measurements [J] . Ugur Cem Hasar IEEE sensors journal . 2016,第13期

机译：通过与校准无关的测量来明确确定中损耗材料的介电常数
3. Influence of the Induction src="/images/tex/38458.gif" alt="boldsymbol {B}(boldsymbol {t})"> Shape on Hysteresis and Loss Measurements of Soft Magnetic Materials [J] . R. Sato Turtelli, M. Antoni, R. Grössinger, IEEE Transactions on Magnetics . 2016,第5期

机译：归纳 src =“ / images / tex / 38458.gif” alt =“ boldsymbol {B}（boldsymbol {t}）”> 形状对磁滞和损耗测量的影响软磁材料
4. Loss measurement for SCF materials [C] . Mianyu Dong, Limin Tong, Zu-chang Ding Fiber optic materials and components conference . 1994

机译：SCF材料的损耗测量
5. Temperature-dependent extended electron energy loss fine structure measurements from K, L(23), and M(45) edges in metals, intermetallic alloys, and nanocrystalline materials. [D] . Okamoto, James Kozo. 1993

机译：从金属，金属间合金和纳米晶体材料中的K，L（23）和M（45）边缘得出的温度相关的扩展电子能量损耗精细结构测量结果。
6. Inductively Coupled Plasma Mass Spectrometry as a Reference Method to Evaluate Serum Calcium Measurement Bias and the Commutability of Processed Materials during Routine Measurements [O] . Hai-Jian Zhao, Meng-Lei Ge, Yin Yan, 2018

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7. MICROWAVE METHOD FOR THICKNESS-INDEPENDENT PERMITTIVITY EXTRACTION OF LOW-LOSS DIELECTRIC MATERIALS FROM TRANSMISSION MEASUREMENTS [O] . Ugur Cem Hasar 2010

机译：微波法从透射测量开始厚度无介电材料的厚度介电常数
8. Measurements of the Relative Permittivity and the Loss Tangent of Dielectric Materials (Metoder foer Maetning av Materialegenskaperna hos Dielektriska Material) [R] . Bergquist, A. 1990

机译：介电材料的相对介电常数和损耗角正切的测量（metoder foer maetning av materialegenskaperna hos Dielektriska material）

Loss measurement for SCF materials

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