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Hydrogen-vacancy complexes and their deep states in n-type silicon

机译:n型硅中的氢空位络合物及其深态

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摘要

The evolution of irradiation-induced and hydrogen-related defects in n-type silicon in the temperature range 0 - 300 ℃ has been studied by deep level transient spectroscopy (DLTS) and minority carrier transient spectroscopy (MCTS). Implantation of a box-like profile of hydrogen was performed into the depletion region of a Schottky diode to undertake the DLTS and MCTS measurements. Proportionality between the formation of two hydrogen-related deep states and a decrease of the vacancy-oxygen center concentration was found together with the appearance of new hydrogen-related energy levels.
机译:利用深能级瞬态光谱法(DLTS)和少数载流子瞬态光谱法(MCTS)研究了0-300℃温度范围内n型硅中辐照引起的缺陷和氢相关缺陷的演化。将盒形轮廓的氢注入到肖特基二极管的耗尽区中以进行DLTS和MCTS测量。发现两个氢相关的深状态的形成与空位-氧中心浓度的降低之间的比例,以及新的氢相关的能级的出现。

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  • 来源
  • 会议地点 Bad Staffelstein(DE)
  • 作者单位

    University of Oslo, Department of Physics, Center for Materials Science and Nanotechnology,P.O.Box 1048 Blindern, N-0316 Oslo, Norway;

    University of Oslo, Department of Physics, Center for Materials Science and Nanotechnology,P.O.Box 1048 Blindern, N-0316 Oslo, Norway;

    University of Oslo, Department of Physics, Center for Materials Science and Nanotechnology,P.O.Box 1048 Blindern, N-0316 Oslo, Norway;

    University of Oslo, Department of Physics, Center for Materials Science and Nanotechnology,P.O.Box 1048 Blindern, N-0316 Oslo, Norway;

    University of Oslo, Department of Physics, Center for Materials Science and Nanotechnology,P.O.Box 1048 Blindern, N-0316 Oslo, Norway;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Silicon; hydrogen; vacancy-hydrogen complexes; implantation; DLTS; MCTS;

    机译:硅;氢;空位-氢络合物;植入DLTS; MCTS;

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