A Density Functional Study of Iron Segregation at ISFs and Σ5-(001) GBs in mc-Si

著录项

• 来源
  《Gettering and defect engineering in semiconductor technology XVI》|2015年|224-229|共6页
• 会议地点 Bad Staffelstein(DE)
• 作者

  Oras A Al-Ani; J P Goss; N E B Cowern; P R Briddon; M Al-Hadidi; R Al-Hamadany; M J Rayson;

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• 作者单位

  School of Electrical and Electronic Engineering, Newcastle University, UK;

  School of Electrical and Electronic Engineering, Newcastle University, UK;

  School of Electrical and Electronic Engineering, Newcastle University, UK;

  School of Electrical and Electronic Engineering, Newcastle University, UK;

  School of Electrical and Electronic Engineering, Newcastle University, UK;

  School of Electrical and Electronic Engineering, Newcastle University, UK;

  Department of Chemistry, University of Surrey, UK;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  silicon; iron; segregation; grain boundaries;

  机译：硅;铁;隔离晶界;