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首页> 外文会议>Infrared spaceborne remote sensing and instrumentation XVI >Precision radiometry using a tunable InAs/InGaAs quantum dot in a well infrared focal plane array
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Precision radiometry using a tunable InAs/InGaAs quantum dot in a well infrared focal plane array

机译：在井红外焦平面阵列中使用可调谐的InAs / InGaAs量子点进行精密辐射测定

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摘要

Infrared imaging has typically relied on quantum well and quantum dot focal plane arrays which inherently have a narrow spectral response. In order to detect 'color' information within the infrared spectrum, several detectors are used with a filtering scheme to sample different wavelengths and the data is post-processed to yield multi-spectral images. Using the 320 × 256 pixel quantum dot-in-a-well (DWELL) infrared focal plane arrays developed by the University of New Mexico's Center for High Technology Materials offers numerous advantages including wide spectral response (1 μm to 30 μm +) and response tunability. The latter of these allows multi-spectral imaging without switchable filters. A simple external bias voltage is applied to tune spectral response on a pixel by pixel basis. This presentation outlines the work to date and future work to be accomplished on this project to implement tunable color imaging capabilities in several wavelengths throughout the infrared spectrum using the DWELL structure. Precision radiometry, similar to astronomical photometry using a charge coupled device, will be realized in addition to color imaging capabilities, requiring a full characterization of noise processes and techniques for noise reduction in this novel device.
机译：红外成像通常依赖于固有具有窄光谱响应的量子阱和量子点焦平面阵列。为了检测红外光谱内的“颜色”信息，使用了几种带有过滤方案的检测器来采样不同的波长，并对数据进行后处理以生成多光谱图像。使用新墨西哥大学高科技材料中心开发的320×256像素量子孔内（DWELL）红外焦平面阵列可提供众多优势，包括宽光谱响应（1μm至30μm+）和响应可调性。这些中的后者允许多光谱成像而无需可切换的滤光片。施加简单的外部偏置电压以逐个像素地调整光谱响应。本演讲概述了迄今为止的工作以及该项目要完成的工作，以使用DWELL结构在整个红外光谱中的几个波长上实现可调彩色成像功能。除了使用彩色成像功能之外，还将实现类似于使用电荷耦合器件的天文光度学的精密辐射测量，这需要对噪声过程和噪声降低技术进行全面表征。

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  • 来源
  • 会议地点 San Diego CA(US)
  • 作者

    Jonathan R. Andrews; Sergio R. Restaino; Scott W. Teare; Sanjay Krishna; Luke Lester; Christopher C. Wilcox; Ty Martinez; Freddie Santiago;

  • 作者单位

    Naval Research Laboratory Remote Sensing Division, Code 7216 3550 Aberdeen Ave SE KirtlandAFB,NM 87117;

    Naval Research Laboratory Remote Sensing Division, Code 7216 3550 Aberdeen Ave SE KirtlandAFB,NM 87117;

    New Mexico Institute of Mining and Technology Electrical Engineering Department 801 Leroy Place Socorro,NM 87801;

    University of New Mexico Center for High Technology Materials 1313GoddardSE Albuquerque, NM 87106;

    University of New Mexico Center for High Technology Materials 1313GoddardSE Albuquerque, NM 87106;

    Naval Research Laboratory Remote Sensing Division, Code 7216 3550 Aberdeen Ave SE KirtlandAFB,NM 87117;

    Naval Research Laboratory Remote Sensing Division, Code 7216 3550 Aberdeen Ave SE KirtlandAFB,NM 87117;

    Naval Research Laboratory Remote Sensing Division, Code 7216 3550 Aberdeen Ave;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 V443.5;
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