Department of Electronic Information Materials, School of Materials Science and Engineering,Shanghai University, 149 Yanchang Road, Shanghai 200072, China;
Department of Electronic Information Materials, School of Materials Science and Engineering,Shanghai University, 149 Yanchang Road, Shanghai 200072, China;
Department of Electronic Information Materials, School of Materials Science and Engineering,Shanghai University, 149 Yanchang Road, Shanghai 200072, China;
Department of Electronic Information Materials, School of Materials Science and Engineering,Shanghai University, 149 Yanchang Road, Shanghai 200072, China;
Thin film; Scandium; Aluminum Nitride; Structure; Optical property;
机译:在ALN,AL_(1-X)SC_XN和AL_(1-X)B_XN薄膜中强烈温度依赖性铁电切换
机译:关于铁电AL_(1-X)SC_XN薄膜的卓越温度稳定性
机译:压电Al_(1-x)Sc_xN薄膜:一种用于机械能收集和传感器的半导体兼容解决方案
机译:AL_(1-X)SC_XN薄膜的结构和光学性质
机译:镧镍氧化物电极上MOCVD衍生的钙钛矿铅锆(x)钛(1-x)氧(3)和铅(scan钽)(1-x)钛(x)氧(3)薄膜的微观结构和电性能缓冲硅
机译:通过氧化Au-Sn金属间化合物制造的纳米结构薄膜的微观结构和光学性质
机译:烧结气氛对喷墨印刷Znxcu(1-X)Fe2O4薄膜的光学,热和电性能的影响