Determination of the reference impedance of Line - Attenuator - Reflect for on-wafer vector network analyzer calibration

机译：确定晶片上矢量网络分析仪的线-衰减器-反射参考阻抗的确定。

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A determination of the reference impedance for the three standards line-attenuator-reflect (LAR) on-wafer vector network-analyzer (VNA) calibration is proposed. As a result, it is shown that the reference impedance to which the LAR calibration is referred cannot generally be determined. Based on this consideration, a modified LAR calibration allows a precise determination of the reference impedance so that the calibration accuracy is improved. Measurement results, compared to those obtained using the conventional multiline TRL calibration, show the efficiency of the proposed method up to 45 GHz.

机译：提出了三种标准线衰减器反射（LAR）晶圆上矢量网络分析仪（VNA）校准的参考阻抗的确定方法。结果表明，通常无法确定LAR校准所参考的参考阻抗。基于此考虑，改进的LAR校准可精确确定参考阻抗，从而提高校准精度。与使用常规多线TRL校准获得的测量结果相比，测量结果表明，所提方法的效率高达45 GHz。

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《Instrumentation and Measurement Technology Conference, 2009. I2MTC '09》|2009年|642-645|共4页
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Bahouche M.; Bergeault E.; Allal D.;
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Lab. Nat. de Metrol. et d'Essais (LNE), Trappes, France;

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attenuators; calibration; impedance matching; network analysers; LAR; VNA calibration; line-attenuator-reflect; on-wafer vector network-analyzer; reference impedance determination; component; reference impedance; scattering parameters; standards;

机译：衰减器;校准;阻抗匹配;网络分析仪; LAR; VNA校准;线路衰减器反射;晶圆上矢量网络分析仪;参考阻抗确定;成分;参考阻抗;散射参数;标准;

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专利

1. On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers [J] . Valeria Teppati, Andrea Ferrero IEEE Transactions on Microwave Theory and Techniques . 2005,第11期

机译：部分泄漏的多端口矢量网络分析仪的晶圆校准算法
2. Vector Network Analyzer Calibration Using a Line and Two Offset Reflecting Loads [J] . Pulido-Gaytan, M.A., Reynoso-Hernandez, IEEE Transactions on Microwave Theory and Techniques . 2013,第9期

机译：使用一条线和两个偏移反射负载进行矢量网络分析仪校准
3. Broadband Space Conservative On-Wafer Network Analyzer Calibrations With More Complex Load and Thru Models [J] . Sathya Padmanabhan, Lawrence Dunleavy, John E. Daniel, IEEE Transactions on Microwave Theory and Techniques . 2006,第9期

机译：具有更复杂的负载和直通模型的宽带空间节约型晶片网络分析仪校准
4. Determination of the Reference Impedance of Line - Attenuator - Reflect for On-Wafer Vector Network Analyzer Calibration [C] . Mebrouk Bahouche, Eric Bergeault, Djamel Allal IEEE Instrumentation Measurement Technology Conference . 2009

机译：线路衰减器参考阻抗的测定 - 对晶圆矢量网络分析仪校准反射
5. Measurement-based modeling of vector network analyzer calibration standards and nonlinear microwave devices using artificial neural networks. [D] . Jargon, Jeffrey Arendt. 2003

机译：矢量网络分析仪校准标准和基于人工神经网络的非线性微波设备的基于测量的建模。
6. On-Wafer Calibration Algorithm for Partially Leaky Multiport Vector Network Analyzers [O] . Teppati, Valeria, Ferrero, Andrea Pierenrico 2005

机译：部分泄漏的多端口矢量网络分析仪的晶圆校准算法
7. On-wafer vector network analyzer measurements in the 220-325 Ghz frequency band [R] . Fung, King Man Andy, Dawson, D., Samoska, L., 2006

机译：晶圆上矢量网络分析仪测量220-325 Ghz频段

Determination of the reference impedance of Line - Attenuator - Reflect for on-wafer vector network analyzer calibration

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